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Keithley 2520 Pulsed Laser Diode Test System

Keithley 2520 Pulsed Laser Diode Test System
Keithley 2520 Pulsed Laser Diode Test System
  
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We only sell this product to Mexico
Our Price: $40,890.00 USD


Availability: 4 to 6 weeks
Product Code: 2520

Description
 
Features
  • Simplifies laser diode LIV testing prior to packaging or active temperature control
  • Integrated solution for in-process LIV production testing of laser diodes at the chip or bar level
  • Sweep can be programmed to stop on optical power limit
  • Combines high accuracy source and measure capabilities for pulsed and DC testing
  • Synchronized DSP based measurement channels ensure highly accurate light intensity and voltage measurements
  • Programmable pulse on time from 500ns to 5ms up to 4% duty cycle
  • Pulse capability up to 5A, DC capability up to 1A
  • 14-bit measurement accuracy on three measurement channels (VF, front photodiode, back photodiode)
  • Measurement algorithm increases the pulse measurement's signal-to-noise ratio
  • Up to 1000-point sweep stored in buffer memory eliminates GPIB traffic during test, increasing throughput
  • Digital I/O binning and handling operations
  • IEEE-488 and RS-232 interfaces

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