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Keithley 2612B System Sourcemeter - Dual Channel, (100fA, 200V, 1.5A DC/10A Pulse)

Keithley 2612B System Sourcemeter - Dual Channel, (100fA, 200V, 1.5A DC/10A Pulse)
Keithley 2612B System Sourcemeter - Dual Channel, (100fA, 200V, 1.5A DC/10A Pulse)
 
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Our Price: $16,450.00 USD


Availability: 4 to 6 weeks
Product Code: 2612B

Description
 
Features
  • Source/Measure Capabilities

  • • Dual channel model with 60W power
    output (30W/channel)
  • • 4 quadrant source/measure with
    6˝-digit resolution
  • • Current Max/Min: 1.5A DC, 10A pulse/ 100fA
  • • Voltage Max/Min: 200V/ 100nV
  • General Features

  • • Built-in "Plug & Play" Java-Based I-V
    characterization and test software
  • • TSP® (Test Script Processing) technology
    embeds complete test programs
    inside the instruments
  • • TSP-Link® expansion technology for
    multi-channel parallel test
  • • Software emulation for Keithley's Model
    2400 SourceMeter SMU Instrument
    • Large, easy-to-read, dual line display

The Model 2612B SourceMeter® SMU instrument, part of the Series 2600B SourceMeter SMU Instruments family, is a new and improved two-channel SMU instrument with a tightly integrated four-quadrant design that allows it to simultaneously source and measure both voltage and current to boost productivity in applications ranging from R&D to automated production test. In addition to retaining all the features of the Model 2612A, the Model 2612B has 6&189;-digit resolution, USB 2.0 connectivity, and software command emulation of the Model 2400 SourceMeter SMU Instrument to enable easy migration of legacy test code. The Model 2612B is equipped with Keithley's high speed TSP® technology (over 190% faster than traditional PC-to-instrument communication techniques,) which dramatically improves the system-level speed to lower the cost of test. The TSP-Link® interface enables multi-channel parallel test and expands the test system without the cost of a mainframe. The wide range of 1.5A DC, 10A pulse, 200V output makes the Model 2612B suitable for testing a wide range of higher voltage and higher current devices materials, components, and sub-assemblies.

I-V capability Series 2600B is over 200 percent faster than closest competitive SMU due to embedded TSP technology as seen here in a typical LED test


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